Our article about “Automated identification and classification of single particle serial femtosecond X-ray diffraction data” (also known as “hit-finding”) has been published in Optics Express 22, pp 2497-2510 (2014). In an experiment which produced copious amounts of data, we use both algorithms analyzing diffraction images and time-of-flight spectroscopy to find when a particle is hit by the X-ray laser.